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EVENT INFORMATION

Conference Announcement

Title: IS&T/SPIE Electronic Imaging Conference Wavelet Applications in Industrial Processing VII
Abbreviaton: not specified
Place: San Jose, CA
Begin Date: 17 January 2010
End Date: 21 January 2010
Registration
up to: 		not specified
Description: This conference is intended to bring together practitioners, researchers, and technologists in machine vision, sensors, non destructive testing, signal and image processing to share recent developments in wavelet and multiresolution approaches. Papers emphasizing fundamental methods that are widely applicable to image processing, industrial inspection and other industrial applications are especially welcome

New trends in wavelet and multiresolution approach, frame and overcomplete representations, Gabor transform, space-scale and space-frequency analysis, multiwavelets, directional wavelets, lifting scheme, empirical mode decomposition for:

  • sensors
  • signal and image denoising, enhancement, segmentation, image deblurring
  • texture analysis
  • pattern recognition
  • shape recognition
  • 3D surface analysis, characterization, compression
  • acoustical signal processing
  • stochastic signal analysis
  • seismic data analysis
  • real-time implementation
  • image compression
  • hardware, wavelet chips
Address: not specified
Country: U.S.A. Scope of Interest: global
URL: http://spie.org/
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